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Principal Investigator
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Energy harvesting & storage devices
Novel semiconductor devices and sensors
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3D printing materials and filter media
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Measurement
2018.08.09 21:22
Atomic Force Microscope with PFM
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Bending stage
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2018.03.26
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Agilent 34401A multimeter
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Agilent 34401A multimeter
2018.03.25
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Atomic Force Microscope with PFM
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2018.08.09
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Agilent 34401A multimeter
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2018.03.25
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